Location: Break-out room 6/7, Level 02, Great Northern Hall, G-mex Centre, Manchester

Introductory workshop.
Wednesday 13^th September, 1 – 5pm

Modern 3D EM simulation tools offer benefits such as shorter and more cost effective development cycles through automatic optimisation and parameter studies. Virtual prototyping radically reduces cut-and-try iterations in your design process.
This introductory workshop is free of charge and will present CST's "Connected" approach to 3D EM simulation.

Programme Overview
Presentation
Introduction into the CST world
Connect I: CAD data, EDA tool integration, circuit simulator integration
Connect II: Integration of different technologies in one package
Application example overview
Hands-on
Connect III: Connect yourself with CST MICROWAVE STUDIO® and try out for yourself how easy and powerful 3D EM simulation can be

CST Advanced User Workshop
Thursday 14^th September, 10am – 12 noon

Customers and testers of CST STUDIO SUITE™ tools are invited to participate in CST’s advanced user workshop at EuMW.

Programme Overview
A look at the new release CST STUDIO SUITE™ version 2006B
CST MICROWAVE STUDIO^®’s (CST MWS) new and improved links with CAD and EDA tools: Cadence, Mentor, Zuken
New coupling of internal solver technology:
RF / thermal coupling,
Magneto-static / RF coupling for ferrites
New MLFMM solver for electrically large structures
New capabilities of HF-TET frequency domain and transient solvers
Incorporate Mode Matching through CST DESIGN STUDIO™
CST PARTICLE STUDIO™
Tips and tricks to enhance your daily work with CST STUDIO SUITE™ tools

Seating is limited for these events. Advance on-line registration is recommended.

About CST
CST is one of the two largest suppliers of electromagnetic simulation software and has continuously enhanced its position as market and technology leader in 3D Time Domain simulation. With over 80 employees worldwide and a network of qualified distributors, 120 people are dedicated to the development and support of its EM products in more than 30 countries. Information about CST is available on the web at www.cst.com.

For more information, programme details and registration visit: www.agilent.co.uk/find/eumw06

Location: Victoria Bar, G-Mex
Tuesday 12^th September, 09.30 – 11.00

Scalar Measurements in Uncharted Territory: Beyond 50 GHz to 325 GHz
Component and waveguide design and test engineers working in the millimeter-wave (30 GHz to 300 GHz) bands will benefit from the novel Mixer-based Scalar Stimulus Response (MSSR) technique described here. The millimeter wave stimulus signal is generated using a multiplier and microwave synthesizer and the response is down converted to an intermediate frequency (IF) using external millimeter wave harmonic mixers.  The response is shown on a microwave spectrum analyzer.  The signal generator power and frequency are controlled by the spectrum analyzer.  The technique can be used to cover the complete waveguide (WG) band up to 325 GHz.  Performance, advantages and limitations of the MSSR technique are discussed.

Tuesday 12^th September, 11.00 – 12.20

A New Synthetic Instrument Architecture for ATE Systems
Today’s modern Automated Test Equipment (ATE) systems are an expensive financial investment, and deserve careful consideration of many factors, both technical and economic. When designing an ATE system, it is important to ensure that the test system will evaluate the system under test with a high degree of confidence in the measurements. A second equally important consideration is minimizing the cost of the test system over its lifetime. While it is relatively easy to thoroughly evaluate a complex electronic system by spending a large amount of money, it is a far greater challenge to thoroughly evaluate the system accurately while minimizing the cost of the ATE system.

Traditional rack-and-stack ATE test systems have been in use for years, but economic and competitive pressures are causing designers and users of ATE systems to look for a more cost effective way of achieving the test functionality they need, while minimizing the cost of the ATE systems over their entire life cycle. A new ATE architecture, known as synthetic instruments, is emerging. This synthetic instrument concept utilizes basic functional measurement modules as building blocks to synthesize a wide variety of different measurements that are normally performed by traditional instrumentation. The synthetic instrument concept uses three basic building blocks, a numeric processor, data converter, and frequency converter to synthesize any desired signal or measure any parameter that can currently be done with traditional instrumentation.

The synthetic instrument concept holds great promise of providing the measurement accuracy and assurance needed by users, to provide the best architecture to ensure the longevity of the ATE system, and minimize the cost of the ATE system over its lifetime. This workshop will examine the synthetic instrument concept in detail, illustrate how the synthetic instrument concept can be beneficial, and provide useful information for designers and users of ATE systems.

Tuesday 12^th September, 13.50 – 15.50

WiMAX Mobile Signal Analysis, Signal Generation, & Troubleshooting Techniques
This workshop will describe physical layer measurement and troubleshooting techniques for mobile WiMAX, also called WiMAX-OFDMA or IEEE 802.16e.

This new wireless networking standard uses a very complicated and dynamic multi-zone OFDM signal structure, resulting in a signal that is also very demanding to process and amplify. WiMAX engineers will be challenged to make both digital modulation quality (RCE/EVM) measurements and high performance traditional RF/microwave measurements such as ACP and CCDF.

The workshop will include a brief introduction to mobile WiMAX concepts and terms, and a comparison with previous OFDM-based networking technologies. The workshop will cover practical signal generation techniques including the creation of multi-zone signals and power boosting. The workshop will also cover signal analysis techniques for R&D and manufacturing environments including spectrum and demodulation, structured around a proven and efficient measurement/troubleshooting sequence. Many typical measurements and displays will be shown, detailing the signal structure and signal quality.

Tuesday 12^th September, 15.50 – 17.30

Maximize Your Signal Source Performance and Measurement Accuracy
For engineers that use RF or microwave signal sources, this workshop provides detailed information about the different types of signal source architecture and investigates how performance attributes affect various types of testing from component characterization to signal simulation. Output power, phase noise, level accuracy, adjacent channel power and many other specifications all contribute to the quality of a given measurement. We will discover how to optimize your source performance for making the best measurement possible. In addition, there will be certain features of the signal source such as switching speed and backwards compatibility discussed that enhance test throughput and reduce the cost of test. Through this workshop you will learn how to interpret the instrument’s data sheet and make rational decisions about which signal source is right for your application.

Wednesday 13^th September, 09.30 – 12.20

Free-Space Materials Measurement Application to Aerospace and Defense Applications
This half day workshop will begin with a review of techniques for measuring complex permittivity, loss tangent as well as permeability of materials. Then, we will move into an in-depth coverage of free-space techniques using a network analyzer and antennae for measuring dielectric, magnetic and absorptive properties of materials. These measurements are often used in the design and test of radome, low observables, and radar absorbing materials used in the aerospace defense industry, but this non-contacting method is useful for other materials as well. Both Reflection/Transmission and NRL Arch techniques will be discussed. These techniques are applicable to frequencies from the low GHz up to 325 GHz and beyond. Featured topics will be:

1, Mathematical models for converting S-parameters to complex permittivity.
2, Innovative Free-space Calibration Techniques offered by Agilent
3, Antennae and fixturing considerations.
4. Sample considerations.
5. Hands-on measurement demonstration.

Wednesday 13^th September, 13.50 – 17.30

Advanced RF System and Circuit Synthesis Technologies in ADS
Many of the most important choices that influence the performance and cost of components and systems are typically made in the early stages of the design. The ability to make quick and extensive trade-off analyses and to select the optimal topology is a critical element in the development of today’s complex high-frequency communication and defense systems, particularly in the area of uW/RF circuits and subsystems.

To address this need Agilent EEsof EDA now offers an integrated solution (RF Architect) that includes an advanced RF System simulator and a suite of state-of-the-art RF circuit synthesis tools that address different types of circuits and technologies.

3D Planar and Full 3D Electromagnetic Simulation Solutions
With signal frequencies continuously increasing in both analog and digital domains, efficient EM analysis is becoming more and more important to be able to model the behavior of a wide range of interconnects and passive circuits. Several of these structures are solved more efficiently using 3D Planar simulators such as Agilent EEsof’s Momentum that is constantly improved to increase its speed, capacity and capabilities. For structures that require the generality of full 3D representation, a new EM simulator is now available. During this session we will present the new capabilities of the new full 3D EM simulator as well as recent improvements to Momentum.

Thursday 14^th September, 09.30 – 12.20

On-Wafer Measurement of Differential Devices
This workshop presents some of our recent developments in probe tips, calibration substrates, on-wafer test structures and single-ended-to-differential transformer technology optimized for on-wafer differential measurements. Several options for differential wafer probe input-output pairs, and single probes with multi-contact membranes combining multiple functions on one contacting structure will be discussed. We will also present recent work on non-linear differential measurements that move beyond the venerable 50 Ω VNA microwave measurement environment.

Thursday 14^th September, 13.50 – 15.50

Signal Simulation and Analysis for Emerging Aerospace and Defense Applications
Over the last 15 years there have been dramatic changes in the types of threats encountered by the military as well as intelligence agencies. These changes have redirected defense and intelligence budgets to the development of ELINT (electronic intelligence) and countermeasures systems that can address the new threats directly. This in turn has prompted changes in the requirements for simulation of the signal environment as well as for surveillance and analysis of signals. This workshop reviews these new threats and how these signal simulation and analysis challenges can be met.

The aerospace and defense community requires a broad array of modulated RF and microwave signals in order to simulate the EM environment in which their systems operate. Constructing and generating the right waveforms for testing can consume extensive amounts of engineering resources and detract attention from the true goal of completing product design. There are many alternatives to select from and these decisions have significant impact on program cost and schedule. This second part of the workshop will show some of the different simulation and analysis methods available and how to choose the right solution for several specific applications in order to minimize the cost of test.

Thursday 14^th September, 15.50 – 17.50

Expanding Phase Noise Measurement Capabilities with Cross-Correlation Technique
As increasing demand of aerospace and defense radars as well as emerging communications for wireless LAN and UWB, testing phase noise is becoming more and more challenging. Phase-noise measurements have traditionally required costly, dedicated system including custom ultra-clean sources. The test setups are usually complicated and time-consuming. This workshop discusses new test techniques with Agilent Signal Source Analyzer (SSA) for phase-noise measurements up to 110 GHz. The digitally controlled PLL phase detector technique makes phase-noise measurements very easy to perform and exceptionally fast. The SSA utilizes an innovative cross-correlation technique that offers ultra-low phase-noise sensitivity at microwave and millimeter-wave frequencies, without relying on a custom ultra-clean reference source. This workshop also discusses the frequency-divider technique that overcomes the difficulty of measuring phase noise of free-running oscillators. This workshop will take 90 minutes for the theory of operation and hands-on lab.